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Accepted Paper10.1234/parness2026.001
AutoFL: Automated Fault Localization via LLM-Driven Test Generation
Yuchen Wang, Jianfei Yu, Yuanjue Fan
Peking University / Tsinghua University
We propose AutoFL, a fully automated fault localization technique that leverages large language models to generate targeted test cases for pinpointing software bugs. Our approach achieves state-of-the-art results on the Defects4J benchmark without any manual intervention.
LLMSEFault LocalizationAutomated Testing